Micronic thermal characterization of vertical interfaces using the photoreflectance method
نویسندگان
چکیده
This paper presents the theoretical and experimental possibilities of a modulated photothermal method, laser induced photoreflectance, for inspecting the quality of interfaces with rnicronic spatial resolutions. An analytical model is established for semi-infinite materials containing an internal interface perpendicular to the sample surface. The presented application is the detection of thermal resistances in damaged materials.
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تاریخ انتشار 2017